|
Title
|
|
|
|
Triple ion beam cutting of diamond/Al composites for interface characterization
|
|
|
Author
|
|
|
|
|
|
|
Abstract
|
|
|
|
| A novel triple ion beam cutting technique was employed to prepare high-quality surfaces of diamond/Al composites for interfacial characterization, which has been unachievable so far. Near-perfect and artifact-free surfaces were obtained without mechanical pre-polishing. Hence, the as-prepared surfaces are readily available for further study and also, ready to be employed in a focus ion beam system for preferential selection of transmission electron microscopy samples. Dramatically different diamond/Al interface configurations - sub-micrometer Al2O3 particles and clean interfaces were unambiguously revealed. |
|
|
|
Language
|
|
|
|
English
|
|
|
Source (journal)
|
|
|
|
Materials characterization. - New York
|
|
|
Publication
|
|
|
|
New York
:
2014
|
|
|
ISSN
|
|
|
|
1044-5803
|
|
|
DOI
|
|
|
|
10.1016/J.MATCHAR.2014.01.008
|
|
|
Volume/pages
|
|
|
|
89
(2014)
, p. 132-137
|
|
|
ISI
|
|
|
|
000333513400015
|
|
|
Full text (Publisher's DOI)
|
|
|
|
|
|
|
Full text (publisher's version - intranet only)
|
|
|
|
|
|