Publication
Title
Triple ion beam cutting of diamond/Al composites for interface characterization
Author
Abstract
A novel triple ion beam cutting technique was employed to prepare high-quality surfaces of diamond/Al composites for interfacial characterization, which has been unachievable so far. Near-perfect and artifact-free surfaces were obtained without mechanical pre-polishing. Hence, the as-prepared surfaces are readily available for further study and also, ready to be employed in a focus ion beam system for preferential selection of transmission electron microscopy samples. Dramatically different diamond/Al interface configurations - sub-micrometer Al2O3 particles and clean interfaces were unambiguously revealed.
Language
English
Source (journal)
Materials characterization. - New York
Publication
New York : 2014
ISSN
1044-5803
Volume/pages
89(2014), p. 132-137
ISI
000333513400015
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 29.01.2014
Last edited 10.09.2017
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