Title
Triple ion beam cutting of diamond/Al composites for interface characterization Triple ion beam cutting of diamond/Al composites for interface characterization
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
article
Publication
New York ,
Subject
Physics
Source (journal)
Materials characterization. - New York
Volume/pages
89(2014) , p. 132-137
ISSN
1044-5803
ISI
000333513400015
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
A novel triple ion beam cutting technique was employed to prepare high-quality surfaces of diamond/Al composites for interfacial characterization, which has been unachievable so far. Near-perfect and artifact-free surfaces were obtained without mechanical pre-polishing. Hence, the as-prepared surfaces are readily available for further study and also, ready to be employed in a focus ion beam system for preferential selection of transmission electron microscopy samples. Dramatically different diamond/Al interface configurations - sub-micrometer Al2O3 particles and clean interfaces were unambiguously revealed.
E-info
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