Title
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Seeing and measuring in 3D with electrons
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Author
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Abstract
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Modern TEM enables the investigation of nanostructures at the atomic scale. However, TEM images are only two-dimensional (2D) projections of a three-dimensional (3D) object. Electron tomography can overcome this limitation. The technique is increasingly focused towards quantitative measurements and reaching atomic resolution in 3D has been the ultimate goal for many years. Therefore, one needs to optimize the acquisition of the data, the 3D reconstruction techniques as well as the quantification methods. Here, we will review a broad range of methodologies and examples. Finally, we will provide an outlook and will describe future challenges in the field of electron tomography. |
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Language
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English
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Source (journal)
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Comptes rendus : physique / Académie des sciences. - Paris, 2002, currens
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Publication
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Paris
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Elsevier
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2014
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ISSN
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1631-0705
[print]
1878-1535
[online]
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DOI
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10.1016/J.CRHY.2013.09.015
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Volume/pages
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15
:2-3
(2014)
, p. 140-150
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ISI
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000334013600005
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Full text (Publisher's DOI)
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Full text (open access)
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Full text (publisher's version - intranet only)
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