Title
Seeing and measuring in 3D with electrons Seeing and measuring in 3D with electrons
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
article
Publication
Paris ,
Subject
Physics
Source (journal)
Comptes rendus physique / Académie des sciences. - Paris, 2002, currens
Volume/pages
15(2014) :2-3 , p. 140-150
ISSN
1631-0705
1878-1535
ISI
000334013600005
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
Modern TEM enables the investigation of nanostructures at the atomic scale. However, TEM images are only two-dimensional (2D) projections of a three-dimensional (3D) object. Electron tomography can overcome this limitation. The technique is increasingly focused towards quantitative measurements and reaching atomic resolution in 3D has been the ultimate goal for many years. Therefore, one needs to optimize the acquisition of the data, the 3D reconstruction techniques as well as the quantification methods. Here, we will review a broad range of methodologies and examples. Finally, we will provide an outlook and will describe future challenges in the field of electron tomography.
E-info
https://repository.uantwerpen.be/docman/iruaauth/f9440f/bd37502.pdf
http://ematweb.cmi.ua.ac.be/emat/postprints/seeing and measuring in 3d with electrons_2014.pdf
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Full text (open access)
https://repository.uantwerpen.be/docman/irua/5029d5/113855.pdf
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