Publication
Title
The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images
Author
Abstract
Language
English
Source (journal)
Micron. - Oxford
Publication
Oxford : 2014
ISSN
0968-4328
Volume/pages
63(2014), p. 57-63
ISI
000338402500011
Full text (Publisher's DOI)
Full text (open access)
UAntwerpen
Faculty/Department
Research group
Project info
ESTEEM 2 - Enabling science and technology through European electron microscopy.
Counting Atoms in Nanomaterials (COUNTATOMS).
Exploring electron vortex beams (VORTEX).
Quantitative three-dimensional structure determination using transmission electron microscopy : from images toward precise three-dimensional structures of nanomaterials at atomic scale.
Quantitative electron microscopy: from experimental measurements to precise numbers.
Revealing the source of emergent properties in complex oxides via direct imaging of charge/orbital/spin ordering.
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 10.02.2014
Last edited 10.02.2018
To cite this reference