Publication
Title
A simple absorption correction for electron probe X-ray microanalysis of bulk samples
Author
Abstract
A simple procedure is proposed for the calculation of the absorption correction factor in electron-probe x-ray microanalysis. It is based on the concept of an effective depth of x-ray production, assuming a rectangular depth distribution function for x-ray generation. This effective x-ray production depth is expressed as a fraction of the x-ray excitation depth given by Whelan's expression. Adequate values for this fraction are presented. Two versions are considered. In the first the effective x-ray production is a function of both the characteristic x-ray energy and the atomic numbers of the matrix elements, whereas in the second one, which is indicated for routine use, the energy dependence is neglected. Calculations pointed to satisfactory results, even for low x-ray energies and high overvoltages.
Language
English
Source (journal)
X-ray spectrometry. - London
Publication
London : 1986
ISSN
0049-8246
Volume/pages
15:2(1986), p. 115-119
ISI
A1986C017300007
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 11.02.2014
Last edited 20.09.2017
To cite this reference