Title
A simple absorption correction for electron probe X-ray microanalysis of bulk samplesA simple absorption correction for electron probe X-ray microanalysis of bulk samples
Author
Faculty/Department
Faculty of Sciences. Chemistry
Research group
AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Publication type
article
Publication
London,
Subject
Chemistry
Source (journal)
X-ray spectrometry. - London
Volume/pages
15(1986):2, p. 115-119
ISSN
0049-8246
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
A simple procedure is proposed for the calculation of the absorption correction factor in electron-probe x-ray microanalysis. It is based on the concept of an effective depth of x-ray production, assuming a rectangular depth distribution function for x-ray generation. This effective x-ray production depth is expressed as a fraction of the x-ray excitation depth given by Whelan's expression. Adequate values for this fraction are presented. Two versions are considered. In the first the effective x-ray production is a function of both the characteristic x-ray energy and the atomic numbers of the matrix elements, whereas in the second one, which is indicated for routine use, the energy dependence is neglected. Calculations pointed to satisfactory results, even for low x-ray energies and high overvoltages.
Handle