Publication
Title
Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation
Author
Abstract
A semi-empirical approach is described for determining the mass per unit area of a sample being analysed. The method can be used to estimate the concentration of minor and trace elements in matrices containing a substantial amount of light elements. The procedure utilizes the coherently and incoherently scattered radiation induced in the sample by the filtered continuum radiation of a rhodium x-ray tube. The relationship between the intensity of the scattered radiation per unit mass and the average atomic number of the sample is established via calibration graphs, which can be applied for different x-ray tube voltages and for different primary beam filters. The overall procedure was validated by the analysis of several geological standards, deposited as thin slurries of unknown thickness either on Mylar foil or on Nuclepore filters.
Language
English
Source (journal)
X-ray spectrometry. - London
Publication
London : 1990
ISSN
0049-8246
Volume/pages
19:1(1990), p. 29-33
ISI
A1990CU24700005
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 24.04.2014
Last edited 04.11.2017
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