Publication
Title
Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation
Author
Abstract
Language
English
Source (journal)
X-ray spectrometry. - London
Publication
London : 1990
ISSN
0049-8246
Volume/pages
19:1(1990), p. 29-33
ISI
A1990CU24700005
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 24.04.2014
Last edited 07.10.2018
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