Title
Atomic number correction in electron probe X-ray microanalysis of curved samples and particles
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
article
Publication
Washington, D.C. ,
Subject
Chemistry
Source (journal)
Analytical chemistry. - Washington, D.C.
Volume/pages
56(1984) :14 , p. 2798-2801
ISSN
0003-2700
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Handle