Micro-determination of zirconium-hafnium ratios in zircons by proton induced X-ray emissionMicro-determination of zirconium-hafnium ratios in zircons by proton induced X-ray emission
Faculty of Sciences. Chemistry
AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Fresenius' Zeitschrift für analytische Chemie. - München, 1947 - 1989
275(1975):5, p. 343-348
University of Antwerp
The zirconium/hafnium ratios of zircons are determined using proton induced X-ray emission. Submilligram samples, imbedded in a starch layer and deposited on a 50 μg/cm2 polystyrene carrier, are irradiated for 1020 min with a 5 nA beam of 3.7 MeV protons, while the Hf-Lβ and Zr-Kα X-rays are counted with a Si(Li) detector. The standard deviation per analysis is in the 36 % range. Only few interferences are possible. To eliminate errors due to absorption effects the zircon layer thickness should be above 40 μm or reproducibly thin samples should be employed. Measuring the Hf-Lβ/Hf-Lα ratio for samples and standards might provide a practical check for the absence of absorption errors. The sensitivity is so favourable that, in practice, the minimal sample size is only limited by the minimal amount that can be handled properly.