Publication
Title
Micro-determination of zirconium-hafnium ratios in zircons by proton induced X-ray emission
Author
Abstract
The zirconium/hafnium ratios of zircons are determined using proton induced X-ray emission. Submilligram samples, imbedded in a starch layer and deposited on a 50 μg/cm2 polystyrene carrier, are irradiated for 1020 min with a 5 nA beam of 3.7 MeV protons, while the Hf-Lβ and Zr-Kα X-rays are counted with a Si(Li) detector. The standard deviation per analysis is in the 36 % range. Only few interferences are possible. To eliminate errors due to absorption effects the zircon layer thickness should be above 40 μm or reproducibly thin samples should be employed. Measuring the Hf-Lβ/Hf-Lα ratio for samples and standards might provide a practical check for the absence of absorption errors. The sensitivity is so favourable that, in practice, the minimal sample size is only limited by the minimal amount that can be handled properly.
Language
English
Source (journal)
Fresenius' Zeitschrift für analytische Chemie. - München, 1947 - 1989
Publication
München : 1975
ISSN
0016-1152
Volume/pages
275:5(1975), p. 343-348
Full text (Publishers DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
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Record
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Creation 05.05.2014
Last edited 23.12.2015
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