Publication
Title
Shaping electron beams for the generation of innovative measurements in the (S)TEM
Author
Abstract
In TEM, a typical goal consists of making a small electron probe in the sample plane in order to obtain high spatial resolution in scanning transmission electron microscopy. In order to do so, the phase of the electron wave is corrected to resemble a spherical wave compensating for aberrations in the magnetic lenses. In this contribution, we discuss the advantage of changing the phase of an electron wave in a specific way in order to obtain fundamentally different electron probes opening up new applications in the (S)TEM. We focus on electron vortex states as a specific family of waves with an azimuthal phase signature and discuss their properties, production and applications. The concepts presented here are rather general and also different classes of probes can be obtained in a similar fashion, showing that electron probes can be tuned to optimize a specific measurement or interaction.
Language
English
Source (journal)
Comptes rendus physique / Académie des sciences. - Paris, 2002, currens
Publication
Paris : 2014
ISSN
1631-0705 [print]
1878-1535 [online]
Volume/pages
15:2-3(2014), p. 190-199
ISI
000334013600009
Full text (Publisher's DOI)
Full text (open access)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 19.05.2014
Last edited 09.07.2017
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