Title
Optimal sample preparation to characterize corrosion in historical photographs with analytical TEM Optimal sample preparation to characterize corrosion in historical photographs with analytical TEM
Author
Faculty/Department
Faculty of Sciences. Physics
Faculty of Design Sciences
Publication type
article
Publication
Cambridge, Mass. ,
Subject
Physics
Chemistry
Source (journal)
Microscopy and microanalysis. - Cambridge, Mass.
Volume/pages
20(2014) :5 , p. 1585-1590
ISSN
1431-9276
ISI
000345742900031
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
An alternative focused ion beam preparation method is used for sampling historical photographs containing metallic nanoparticles in a polymer matrix. We use the preparation steps of classical ultra-microtomy with an alternative final sectioning with a focused ion beam. Transmission electron microscopy techniques show that the lamella has a uniform thickness, which is an important factor for analytical transmission electron microscopy. Furthermore, the method maintains the spatial distribution of nanoparticles in the soft matrix. The results are compared with traditional preparation techniques such as ultra-microtomy and classical focused ion beam milling.
E-info
https://repository.uantwerpen.be/docman/iruaauth/433456/49d94b5b599.pdf
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