Title
Structures in textured Cu-Al-Ni shape memory thin films grown by sputtering Structures in textured Cu-Al-Ni shape memory thin films grown by sputtering
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
article
Publication
New York ,
Subject
Physics
Source (journal)
Materials characterization. - New York
Volume/pages
96(2014) , p. 256-262
ISSN
1044-5803
ISI
000343346400032
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
The structure and texture formation in CuAlNi thin films of different thicknesses (1 μm to 5 μm) grown by DC magnetron sputtering without any intentional heating of the substrate are reported. The as-grown films present grains with an average size of 20 nm. The films with thickness of 1 μm have a single metastable phase with a hexagonal structure and are textured with planes (0002) parallel to the plane of the films. It was observed that thicker films present phase coexistence between metastable hexagonal and body centered cubic structures with a gradual increment of the body centered cubic phase fraction. The films with thickness of 5 μm are textured with planes (0002) and View the MathML source101¯0 in the hexagonal structure, whereas in the body centered cubic structure the films are textured with {110} planes parallel to the plane of the films. This fact can be associated with self-heating of the substrate during the growth of the films and with the relative stability of the metastable phases. Free standing films annealed in a second step (1123 K for 1 h) present austenitic phase with L21 structure and sub-micrometric grains textured with {220}L21 planes parallel to the plane of the films. The martensitic transformation temperature was determined from the analysis of resistance against temperature measurements.
E-info
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Full text (open access)
https://repository.uantwerpen.be/docman/irua/ebb2ae/8228.pdf
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