Publication
Title
Superior reliability of junctionless pFinFETs by reduced oxide electric field
Author
Abstract
Language
English
Source (journal)
IEEE electron device letters
Publication
2014
ISSN
0741-3106
Volume/pages
35:12(2014), p. 1179-1181
ISI
000345575400006
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 13.01.2015
Last edited 09.02.2018
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