Publication
Title
Integrated atomistic chemical imaging and reactive force field molecular dynamic simulations on silicon oxidation
Author
Abstract
Language
English
Source (journal)
Applied physics letters / American Institute of Physics. - New York, N.Y., 1962, currens
Publication
New York, N.Y. : American Institute of Physics, 2015
ISSN
0003-6951 [print]
1077-3118 [online]
Volume/pages
106:1(2015), 5 p.
Article Reference
011602
ISI
000347976900008
Medium
E-only publicatie
Full text (Publisher's DOI)
Full text (open access)
UAntwerpen
Faculty/Department
Research group
Project info
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 16.01.2015
Last edited 14.02.2018
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