Publication
Title
Accurate evaluation of μ-PIXE and μ-XRF spectral data through iterative least squares fitting
Author
Language
English
Source (journal)
Nuclear instruments and methods. - Amsterdam
Publication
Amsterdam : 1996
ISSN
0029-554X
Volume/pages
B109/110(1996), p. 179-185
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Record
Identification
Creation 08.10.2008
Last edited 23.12.2015
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