Title
Optimal experimental design for nano-particle atom-counting from high-resolution STEM images Optimal experimental design for nano-particle atom-counting from high-resolution STEM images
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
article
Publication
Amsterdam ,
Subject
Physics
Chemistry
Source (journal)
Ultramicroscopy. - Amsterdam
Volume/pages
151(2015) , p. 46-55
ISSN
0304-3991
ISI
000351237800007
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
In the present paper, the principles of detection theory are used to quantify the probability of error for atom-counting from high resolution scanning transmission electron microscopy (HR STEM) images. Binary and multiple hypothesis testing have been investigated in order to determine the limits to the precision with which the number of atoms in a projected atomic column can be estimated. The probability of error has been calculated when using STEM images, scattering cross-sections or peak intensities as a criterion to count atoms. Based on this analysis, we conclude that scattering cross-sections perform almost equally well as images and perform better than peak intensities. Furthermore, the optimal STEM detector design can be derived for atom-counting using the expression for the probability of error. We show that for very thin objects LAADF is optimal and that for thicker objects the optimal inner detector angle increases.
E-info
https://repository.uantwerpen.be/docman/iruaauth/2f7290/132b9e12abb.pdf
Full text (open access)
https://repository.uantwerpen.be/docman/irua/c79927/9617.pdf
E-info
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