Title
Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
article
Publication
Amsterdam ,
Subject
Physics
Chemistry
Source (journal)
Ultramicroscopy. - Amsterdam
Volume/pages
151(2015) , p. 56-61
ISSN
0304-3991
ISI
000351237800008
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
Quantitative annular dark field scanning transmission electron microscopy (ADF STEM) has become a powerful technique to characterise nano-particles on an atomic scale. Because of their limited size and beam sensitivity, the atomic structure of such particles may become extremely challenging to determine. Therefore keeping the incoming electron dose to a minimum is important. However, this may reduce the reliability of quantitative ADF STEM which will here be demonstrated for nano-particle atom-counting. Based on experimental ADF STEM images of a real industrial catalyst, we discuss the limits for counting the number of atoms in a projected atomic column with single atom sensitivity. We diagnose these limits by combining a thorough statistical method and detailed image simulations.
E-info
https://repository.uantwerpen.be/docman/iruaauth/856df6/01b57b9defe.pdf
Full text (open access)
https://repository.uantwerpen.be/docman/irua/ccb381/9616.pdf
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