Title
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Shelf life degradation of bulk heterojunction solar cells : intrinsic evolution of charge transfer complex
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Author
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Abstract
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Achievement of long-term stability of organic photovoltaics is currently one of the major topics for this technology to reach maturity. Most of the techniques used to reveal degradation pathways are destructive and/or do not allow for real-time measurements in operating devices. Here, three different, nondestructive techniques able to provide real-time information, namely, film absorbance, capacitance-voltage (C-V), and impedance spectroscopy (IS), are combined over a period of 1 year using non-accelerated intrinsic degradation conditions. It is discerned between chemical modifications in the active layer, physical processes taking place in the bulk of the blend from those at the active layer/contact interfaces. In particular, it is observed that during the ageing experiment, the main source for device performance degradation is the formation of donor-acceptor charge-transfer complex (P3HT(center dot+)-PCBM center dot-) that acts as an exciton quencher. Generation of these radical species diminishes photocurrent and reduces open-circuit voltage by the creation of electronic defect states. Conclusions extracted from absorption, C-V, and IS measurements will be further supported by a range of other techniques such as atomic force microscopy, X-ray diffraction, and dark-field imaging of scanning transmission electron microscopy on ultrathin cross-sections. |
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Language
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English
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Source (journal)
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Advanced energy materials. - Weinheim, 2011, currens
Laser physics review. - Place of publication unknown
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Publication
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Weinheim
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WILEY-VCH Verlag GmbH & Co.
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2015
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ISSN
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1614-6832
[print]
1614-6840
[online]
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DOI
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10.1002/AENM.201401997
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Volume/pages
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5
:7
(2015)
, 8 p.
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Article Reference
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1401997
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ISI
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000352708600013
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Medium
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E-only publicatie
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Full text (Publisher's DOI)
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Full text (open access)
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Full text (publisher's version - intranet only)
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