Publication
Title
A complete comparison of simulated electron diffraction patterns using different parameterizations of the electron scattering factors
Author
Abstract
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2015
ISSN
0304-3991
Volume/pages
155(2015), p. 11-19
ISI
000355211900002
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 02.07.2015
Last edited 18.10.2018
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