Title
Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
article
Publication
Subject
Physics
Engineering sciences. Technology
Source (journal)
Beilstein journal of nanotechnology
Volume/pages
6(2015) , p. 1541-1557
ISSN
2190-4286
ISI
000357977300001
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
A major revolution for electron microscopy in the past decade is the introduction of aberration correction, which enables one to increase both the spatial resolution and the energy resolution to the optical limit. Aberration correction has contributed significantly to the imaging at low operating voltages. This is crucial for carbon-based nanomaterials which are sensitive to electron irradiation. The research of carbon nanomaterials and nanohybrids, in particular the fundamental understanding of defects and interfaces, can now be carried out in unprecedented detail by aberration-corrected transmission electron microscopy (AC-TEM). This review discusses new possibilities and limits of AC-TEM at low voltage, including the structural imaging at atomic resolution, in three dimensions and spectroscopic investigation of chemistry and bonding. In situ TEM of carbon-based nanomaterials is discussed and illustrated through recent reports with particular emphasis on the underlying physics of interactions between electrons and carbon atoms.
Full text (open access)
https://repository.uantwerpen.be/docman/irua/aeda38/a3d989fb.pdf
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