Publication
Title
Measuring lattice strain in three dimensions through electron microscopy
Author
Abstract
The three-dimensional (3D) atomic structure of nanomaterials, including strain, is crucial to understand their properties. Here, we investigate lattice strain in Au nanodecahedra using electron tomography. Although different electron tomography techniques enabled 3D characterizations of nanostructures at the atomic level, a reliable determination of lattice strain is not straightforward. We therefore propose a novel model-based approach from which atomic coordinates are measured. Our findings demonstrate the importance of investigating lattice strain in 3D.
Language
English
Source (journal)
Nano letters / American Chemical Society. - Washington
Publication
Washington : 2015
ISSN
1530-6984
Volume/pages
15:10(2015), p. 6996-7001
ISI
000363003100108
Full text (Publisher's DOI)
Full text (open access)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 26.09.2015
Last edited 07.07.2017
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