|
Title
|
|
|
|
Measuring lattice strain in three dimensions through electron microscopy
|
|
|
Author
|
|
|
|
|
|
|
Abstract
|
|
|
|
| The three-dimensional (3D) atomic structure of nanomaterials, including strain, is crucial to understand their properties. Here, we investigate lattice strain in Au nanodecahedra using electron tomography. Although different electron tomography techniques enabled 3D characterizations of nanostructures at the atomic level, a reliable determination of lattice strain is not straightforward. We therefore propose a novel model-based approach from which atomic coordinates are measured. Our findings demonstrate the importance of investigating lattice strain in 3D. |
|
|
|
Language
|
|
|
|
English
|
|
|
Source (journal)
|
|
|
|
Nano letters / American Chemical Society. - Washington
|
|
|
Publication
|
|
|
|
Washington
:
2015
|
|
|
ISSN
|
|
|
|
1530-6984
|
|
|
DOI
|
|
|
|
10.1021/ACS.NANOLETT.5B03008
|
|
|
Volume/pages
|
|
|
|
15
:10
(2015)
, p. 6996-7001
|
|
|
ISI
|
|
|
|
000363003100108
|
|
|
Pubmed ID
|
|
|
|
26340328
|
|
|
Full text (Publisher's DOI)
|
|
|
|
|
|
|
Full text (open access)
|
|
|
|
|
|