Publication
Title
Electron microscopy of probability currents at atomic resolution
Author
Abstract
Atomic resolution transmission electron microscopy records the spatially resolved scattered electron density to infer positions, density, and species of atoms. These data are indispensable for studying the relation between structure and properties in solids. Here, we show how this signal can be augmented by the lateral probability current of the scattered electrons in the object plane at similar resolutions and fields of view. The currents are reconstructed from a series of three atomic resolution TEM images recorded under a slight difference of perpendicular line foci. The technique does not rely on the coherence of the electron beam and can be used to reveal electric, magnetic, and strain fields with incoherent electron beams as well as correlations in inelastic transitions, such as electron magnetic chiral dichroism.
Language
English
Source (journal)
Physical review letters. - New York, N.Y.
Publication
New York, N.Y. : 2015
ISSN
0031-9007
Volume/pages
115:17(2015), 5 p.
Article Reference
176101
ISI
000363023700011
Medium
E-only publicatie
Full text (Publisher's DOI)
Full text (open access)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 30.11.2015
Last edited 10.07.2017
To cite this reference