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Title
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Focused electron beam induced deposition as a tool to create electron vortices
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Author
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Abstract
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| Focused electron beam induced deposition (FEBID) is a microscopic technique that allows geometrically controlled material deposition with very high spatial resolution. This technique was used to create a spiral aperture capable of generating electron vortex beams in a transmission electron microscope (TEM). The vortex was then fully characterized using different TEM techniques, estimating the average orbital angular momentum to be ∼0.8ℏ per electron with almost 60% of the beam ending up in the ℓ = 1 state. |
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Language
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English
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Source (journal)
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Micron. - Oxford, 1993, currens
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Publication
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Oxford
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Pergamon
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2016
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ISSN
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0968-4328
[print]
1878-4291
[online]
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DOI
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10.1016/J.MICRON.2015.07.011
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Volume/pages
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80
(2016)
, p. 34-38
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ISI
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000366770100006
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Pubmed ID
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26432987
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Full text (Publisher's DOI)
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Full text (open access)
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Full text (publisher's version - intranet only)
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