Publication
Title
Dynamic intensity normalization using eigen flat fields in X-ray imaging
Author
Abstract
In X-ray imaging, it is common practice to normalize the acquired projection data with averaged flat fields taken prior to the scan. Unfortunately, due to source instabilities, vibrating beamline components such as the monochromator, time varying detector properties, or other confounding factors, flat fields are often far from stationary, resulting in significant systematic errors in intensity normalization. In this work, a simple and efficient method is proposed to account for dynamically varying flat fields. Through principal component analysis of a set of flat fields, eigen flat fields are computed. A linear combination of the most important eigen flat fields is then used to individually normalize each X-ray projection. Experiments show that the proposed dynamic flat field correction leads to a substantial reduction of systematic errors in projection intensity normalization compared to conventional flat field correction. (C) 2015 Optical Society of America
Language
English
Source (journal)
Optics express. - -
Publication
2015
ISSN
1094-4087
Volume/pages
23:21(2015), p. 27975-27989
ISI
000366574400107
Full text (Publisher's DOI)
Full text (open access)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 15.01.2016
Last edited 16.09.2017
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