Publication
Title
Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy
Author
Abstract
The concept of compressed sensing was recently proposed to significantly reduce the electron dose in scanning transmission electron microscopy(STEM) while still maintaining the main features in the image. Here, an experimental setup based on an electromagnetic beam blanker placed in the condenser plane of a STEM is proposed. The beam blanker deflects the beam with a random pattern, while the scanning coils are moving the beam in the usual scan pattern. Experimental images at both the medium scale and high resolution are acquired and reconstructed based on a discrete cosine algorithm. The obtained results confirm that compressed sensing is highly attractive to limit beam damage in experimental STEM even though some remaining artifacts need to be resolved.
Language
English
Source (journal)
Applied physics letters / American Institute of Physics. - New York, N.Y., 1962, currens
Publication
New York, N.Y. : American Institute of Physics, 2016
ISSN
0003-6951 [print]
1077-3118 [online]
Volume/pages
108:9(2016), p. 1-5
ISI
000375329200043
Full text (Publisher's DOI)
Full text (open access)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 18.03.2016
Last edited 08.08.2017
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