Title
Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
article
Publication
New York, N.Y. :American Institute of Physics ,
Subject
Physics
Source (journal)
Applied physics letters / American Institute of Physics. - New York, N.Y., 1962, currens
Volume/pages
108(2016) :9 , p. 1-5
ISSN
0003-6951
1077-3118
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
The concept of compressed sensing was recently proposed to significantly reduce the electron dose in scanning transmission electron microscopy(STEM) while still maintaining the main features in the image. Here, an experimental setup based on an electromagnetic beam blanker placed in the condenser plane of a STEM is proposed. The beam blanker deflects the beam with a random pattern, while the scanning coils are moving the beam in the usual scan pattern. Experimental images at both the medium scale and high resolution are acquired and reconstructed based on a discrete cosine algorithm. The obtained results confirm that compressed sensing is highly attractive to limit beam damage in experimental STEM even though some remaining artifacts need to be resolved.
Full text (open access)
https://repository.uantwerpen.be/docman/irua/c59219/131895.pdf
Handle