Publication
Title
3D imaging of semiconductor components by discrete laminography
Author
Abstract
Language
English
Source (journal)
AIP conference proceedings / American Institute of Physics. - New York
Publication
New York : 2014
ISSN
0094-243X
Volume/pages
1601(2014), p. 168-179
ISI
000342317500013
Full text (Publisher's DOI)
Full text (open access)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 29.03.2016
Last edited 28.03.2018
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