Title
Point defect reactions in silicon studies **in situ** by high flux electron irradiation in high voltage transmission electron microscopePoint defect reactions in silicon studies **in situ** by high flux electron irradiation in high voltage transmission electron microscope
Author
Faculty/Department
Faculty of Sciences. Physics
Research group
Electron microscopy for materials research (EMAT)
Publication type
article
Publication
Source (journal)
Materials science and technology
Volume/pages
11(1995), p. 1194-1204
1
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
Handle