Title |
|
|
|
Uniform strain in heterostructure tunnel field-effect transistors
|
|
Author |
|
|
|
|
|
Abstract |
|
|
| |
|
Language |
|
|
|
English
|
|
Source (journal) |
|
|
|
IEEE electron device letters |
|
Publication |
|
|
|
2016
|
|
ISSN |
|
|
|
0741-3106
|
|
Volume/pages |
|
|
|
37:3(2016), p. 337-340
|
|
ISI |
|
|
|
000372372100026
|
|
Full text (Publisher's DOI) |
|
|
| |
|
Full text (open access) |
|
|
| |
|
Full text (publisher's version - intranet only) |
|
|
| |
|