Publication
Title
Neural netwok based x-ray tomography for fast inspection of apples on a conveyor belt system
Author
Abstract
Language
English
Source (journal)
Proceedings. - Los Alamitos, Calif, 1994, currens
Source (book)
IEEE International Conference on Image Processing (ICIP), SEP 27-30, 2015, Quebec City, CANADA
Publication
New york : Ieee, 2015
ISBN
978-1-4799-8339-1
Volume/pages
(2015), p. 917-921
ISI
000371977801006
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 06.06.2016
Last edited 09.02.2018
To cite this reference