Publication
Title
Dark field electron holography for quantitative strain measurements with nanometer-scale spatial resolution
Author
Abstract
Language
English
Source (journal)
Applied physics letters / American Institute of Physics. - New York, N.Y., 1962, currens
Publication
New York, N.Y. : American Institute of Physics, 2009
ISSN
0003-6951 [print]
1077-3118 [online]
Volume/pages
95(2009)
Article Reference
053501
ISI
000268809400085
Medium
E-only publicatie
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Publication type
Subject
External links
Web of Science
Record
Identification
Creation 04.11.2016
Last edited 17.08.2018