Publication
Title
Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure
Author
Abstract
Aberration correction in scanning transmission electron microscopy (STEM) has greatly improved the lateral and depth resolution. When using depth sectioning, a technique during which a series of images is recorded at different defocus values, single impurity atoms can be visualised in three dimensions. In this paper, we investigate new possibilities emerging when combining depth sectioning and precise atom-counting in order to reconstruct nanosized particles in three dimensions. Although the depth resolution does not allow one to precisely locate each atom within an atomic column, it will be shown that the depth location of an atomic column as a whole can be measured precisely. In this manner, the morphology of a nanoparticle can be reconstructed in three dimensions. This will be demonstrated using simulations and experimental data of a gold nanorod.
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2017
ISSN
0304-3991
DOI
10.1016/J.ULTRAMIC.2016.11.002
Volume/pages
177 (2017) , p. 36-42
ISI
000401219800006
Pubmed ID
28284056
Full text (Publisher's DOI)
Full text (open access)
UAntwerpen
Faculty/Department
Research group
Project info
Colouring Atoms in 3 Dimensions (COLOURATOM).
Complex hetero-nanosystems: three-dimensional characterisation down to the atomic scale.
Bringing light atoms to light: precise characterization of light-atom nanostructures using transmission electron microscopy.
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 29.11.2016
Last edited 09.10.2023
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