Publication
Title
The influence of the surface binding energy on the emission of secondary ions from elemental targets in secondary ion mass spectrometry
Author
Abstract
Energy distributions of MCs(+) ions, emitted from several elemental (Zn, Ge, Cu, Ni, Mo) targets using Cs+ ion bombardment, were measured. A comparison with the theoretical energy distribution of sputtered neutral atoms M reveals that the MCs(+) distribution and the M distribution depend in the same way on the elements' surface binding energy U-0, Increasing U-0 leads to a broader distribution, characterized by higher mean emission energy. Furthermore, the MCs(+) mass signal increases with a decrease in mean emission energy. This provides evidence for the correlated emission of the two partners forming the MCs(+) molecule.
Language
English
Source (journal)
International journal of mass spectrometry and ion processes. - Amsterdam
Publication
Amsterdam : 1996
ISSN
0168-1176
Volume/pages
152:2/3(1996), p. 209-216
ISI
A1996UA18800012
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 01.08.2017
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