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Title
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The influence of the surface binding energy on the emission of secondary ions from elemental targets in secondary ion mass spectrometry
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Author
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Abstract
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| Energy distributions of MCs(+) ions, emitted from several elemental (Zn, Ge, Cu, Ni, Mo) targets using Cs+ ion bombardment, were measured. A comparison with the theoretical energy distribution of sputtered neutral atoms M reveals that the MCs(+) distribution and the M distribution depend in the same way on the elements' surface binding energy U-0, Increasing U-0 leads to a broader distribution, characterized by higher mean emission energy. Furthermore, the MCs(+) mass signal increases with a decrease in mean emission energy. This provides evidence for the correlated emission of the two partners forming the MCs(+) molecule. |
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Language
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English
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Source (journal)
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International journal of mass spectrometry and ion processes. - Amsterdam, 1983 - 1998
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Publication
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Amsterdam
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1996
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ISSN
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0168-1176
[print]
1873-2801
[online]
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DOI
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10.1016/0168-1176(95)04346-2
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Volume/pages
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152
:2/3
(1996)
, p. 209-216
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ISI
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A1996UA18800012
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Full text (Publisher's DOI)
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Full text (publisher's version - intranet only)
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