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Title
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Transmission electron microscopy on metal-organic frameworks : a review
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Author
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Abstract
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| Versatile materials like metal-organic frameworks require careful characterization. Transmission electron microscopy is a very powerful method that can address a multitude of investigative challenges. In this review we present TEM studies that yielded valuable insights into the investigated MOFs to illustrate the potential of TEM despite the sensitivity of MOFs to the electron beam. |
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Language
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English
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Source (journal)
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Journal of materials chemistry A : materials for energy and sustainability / Royal Society of Chemistry [London] - Cambridge, 2013, currens
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Publication
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Cambridge
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Royal soc chemistry
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2017
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ISSN
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2050-7488
[print]
2050-7496
[online]
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DOI
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10.1039/C7TA00194K
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Volume/pages
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5
:29
(2017)
, p. 14969-14989
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ISI
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000406187800002
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Full text (Publisher's DOI)
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