Publication
Title
Impact of layer alignment on the behavior of tunnel field-effect transistors : an ab initio study
Author
Abstract
Language
English
Source (journal)
Physical review applied. - College Park, Md, 2014, currens
Publication
College Park, Md : American Physical Society, 2017
ISSN
2331-7019 [Online]
Volume/pages
8:3(2017), 7 p.
Article Reference
034017
ISI
000411460400001
Full text (Publisher's DOI)
Full text (open access)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 07.11.2017
Last edited 03.10.2018
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