Title
Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
bookPart
Publication
Vienna :International Atomic Energy Agency, [*]
Source (book)
Reference materials for microanalytical nuclear methods
General
IAEA/AL/095
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
Handle