Publication
Title
Structural characterization of SnS crystals formed by chemical vapour deposition
Author
Abstract
Language
English
Source (journal)
Journal of microscopy. - Oxford
Source (book)
20th International Conference on Microscopy of Semiconducting Materials, (MSM), APR 09-13, 2017, Univ Oxford, Univ Oxford, Oxford, ENGLAND
Publication
Hoboken : Wiley, 2017
ISSN
0022-2720
Volume/pages
268:3(2017), p. 276-287
ISI
000415900300009
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 21.12.2017
Last edited 01.08.2018
To cite this reference