Publication
Title
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation
Author
Abstract
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2018
ISSN
0304-3991
Volume/pages
184:B(2018), p. 29-36
ISI
000417779800004
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.02.2018
Last edited 28.09.2018
To cite this reference