Publication
Title
Method to quantify the delocalization of electronic states in amorphous semiconductors and its application to assessing charge carrier mobility of p-type amorphous oxide semiconductors
Author
Abstract
Language
English
Source (journal)
Physical review B / American Physical Society. - New York, N.Y, 2016, currens
Publication
New York, N.Y : American Physical Society, 2018
ISSN
2469-9969 [online]
2469-9950 [print]
Volume/pages
97:4(2018), 10 p.
Article Reference
045208
ISI
000423427600005
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 06.03.2018
Last edited 10.05.2018
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