Publication
Title
Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy
Author
Abstract
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2018
ISSN
0304-3991
Volume/pages
187(2018), p. 84-92
ISI
000428131200011
Full text (Publisher's DOI)
Full text (open access)
The author-created version that incorporates referee comments and is the accepted for publication version Available from 01.02.2020
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Project info
Complex hetero-nanosystems: three-dimensional characterisation down to the atomic scale.
Bringing light atoms to light: precise characterization of light-atom nanostructures using transmission electron microscopy.
ESTEEM 2 - Enabling science and technology through European electron microscopy.
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 06.03.2018
Last edited 28.09.2018
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