Publication
Title
Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations
Author
Abstract
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2017
ISSN
0304-3991
Volume/pages
176(2017), p. 194-199
ISI
000403992200026
Full text (Publisher's DOI)
Full text (open access)
The author-created version that incorporates referee comments and is the accepted for publication version Available from 10.01.2019
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Project info
Quantitative electron microscopy: from experimental measurements to precise numbers.
Quantitative three-dimensional structure determination using transmission electron microscopy : from images toward precise three-dimensional structures of nanomaterials at atomic scale.
Bringing light atoms to light: precise characterization of light-atom nanostructures using transmission electron microscopy.
Complex hetero-nanosystems: three-dimensional characterisation down to the atomic scale.
ESTEEM 2 - Enabling science and technology through European electron microscopy.
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 19.03.2018
Last edited 25.09.2018
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