Publication
Title
Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations
Author
Abstract
The present contribution gives a review of recent quantification work of atom displacements, atom site occupations and level of crystallinity in various systems and based on aberration corrected HR(S)TEM images. Depending on the case studied, picometer range precisions for individual distances can be obtained, boundary widths at the unit cell level determined or statistical evolutions of fractions of the ordered areas calculated. In all of these cases, these quantitative measures imply new routes for the applications of the respective materials.
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2017
ISSN
0304-3991
Volume/pages
176(2017), p. 194-199
ISI
000403992200026
Full text (Publisher's DOI)
Full text (open access)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Project info
Quantitative electron microscopy: from experimental measurements to precise numbers.
Quantitative three-dimensional structure determination using transmission electron microscopy : from images toward precise three-dimensional structures of nanomaterials at atomic scale.
Bringing light atoms to light: precise characterization of light-atom nanostructures using transmission electron microscopy.
Complex hetero-nanosystems: three-dimensional characterisation down to the atomic scale.
ESTEEM 2 - Enabling science and technology through European electron microscopy.
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 19.03.2018
Last edited 10.09.2021
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