|
Title
|
|
|
|
Determination of the thickness of flat particles by automated electron-microprobe analysis
| |
|
Author
|
|
|
|
| |
|
Language
|
|
|
|
English
| |
|
Source (journal)
|
|
|
|
Analytical chemistry. - Washington, D.C., 1948, currens
| |
|
Publication
|
|
|
|
Washington, D.C.
:
1987
| |
|
ISSN
|
|
|
|
0003-2700
[print]
5206-882X
[online]
| |
|
DOI
|
|
|
|
10.1021/AC00134A002
| |
|
Volume/pages
|
|
|
|
59
:7
(1987)
, p. 930-937
| |
|
ISI
|
|
|
|
A1987G539300003
| |
|
Full text (Publisher's DOI)
|
|
|
|
| |
|