| Title |
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Determination of the thickness of flat particles by automated electron-microprobe analysis
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| Author |
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| Language |
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English
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| Source (journal) |
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Analytical chemistry. - Washington, D.C., 1948, currens | |
| Publication |
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Washington, D.C. : 1987
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| ISSN |
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0003-2700 [print]
5206-882X [online]
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| Volume/pages |
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59:7(1987), p. 930-937
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| ISI |
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A1987G539300003
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| Full text (Publisher's DOI) |
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