Publication
Title
Self-consistent 30-band simulation approach for (non-)uniformly strained confined heterostructure tunnel field-effect transistors
Author
Abstract
Language
English
Source (journal)
International Conference on Simulation of Semiconductor Processes and Devices : [proceedings]. - Piscataway, NJ
Simulation of Semiconductor Processes and, Devices (SISPAD)AND DEVICES (SISPAD 2017)
Source (book)
Proceedings of International Conference on Simulation of Semiconductor Processes and, Devices (SISPAD), SEP 07-09, 2017, Kamakura, JAPAN
Publication
New york : Ieee, 2017
ISBN
978-4-86348-610-2
Volume/pages
(2017), p. 29-32
ISI
000426983300008
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 29.03.2018
Last edited 05.09.2018
To cite this reference