Publication
Title
Pixel purity vertex component analysis
Author
Abstract
Language
English
Source (journal)
IEEE International Geoscience and Remote Sensing Symposium proceedings. - [New York]
Source (book)
IEEE International Geoscience & Remote Sensing Symposium, JUL 23-28, 2017, Fort Worth, TX
Publication
New york : Ieee, 2017
ISBN
978-1-5090-4951-6
Volume/pages
(2017), p. 213-216
ISI
000426954600055
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 04.05.2018
Last edited 28.05.2018
To cite this reference