Publication
Title
Exploring possibilities of band gap measurement with off-axis EELS in TEM
Author
Abstract
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2018
ISSN
0304-3991
Volume/pages
189(2018), p. 76-84
ISI
000432868500008
Pubmed ID
29626835
Full text (Publisher's DOI)
Full text (open access)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Project info
Revealing the source of emergent properties in complex oxides via direct imaging of charge/orbital/spin ordering.
SOLARPAINT: Understanding the durability of light sensitive materials: transferring insights between solar cell physics and the chemistry of paintings.
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 12.06.2018
Last edited 29.08.2020
To cite this reference