Publication
Title
Atomic-scale identification of novel planar defect phases in heteroepitaxial thin films
Author
Abstract
Language
English
Source (journal)
AIP advances / American Institute of Physics. - Melville, NY, 2011, currens
Publication
Melville, NY : American Institute of Physics, 2018
ISSN
2158-3226
Volume/pages
8:5(2018), 7 p.
Article Reference
055022
ISI
000433954000022
Full text (Publisher's DOI)
Full text (open access)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 10.07.2018
Last edited 05.09.2018
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