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Title
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Atomic-scale identification of novel planar defect phases in heteroepitaxial thin films
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Author
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Abstract
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| We have discovered two novel types of planar defects that appear in heteroepitaxial YBa2Cu3O7-delta(YBCO123) thin films, grown by pulsed-laser deposition (PLD) either with or without a La2/3Ca1/3MnO3 (LCMO) overlayer, using the combination of highangle annular dark-field scanning transmission electron microscopy (HAADF-STEM) imaging and electron energy loss spectroscopy (EELS) mapping for unambiguous identification. These planar lattice defects are based on the intergrowth of either a BaO plane between two CuO chains or multiple Y-O layers between two CuO2 planes, resulting in non-stoichiometric layer sequences that could directly impact the high-Tc superconductivity. (C) 2018 Author(s). |
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Language
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English
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Source (journal)
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AIP advances / American Institute of Physics. - Melville, NY, 2011, currens
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Publication
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Melville, NY
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American Institute of Physics
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2018
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ISSN
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2158-3226
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DOI
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10.1063/1.5011761
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Volume/pages
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8
:5
(2018)
, 7 p.
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Article Reference
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055022
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ISI
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000433954000022
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Medium
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E-only publicatie
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Full text (Publisher's DOI)
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Full text (open access)
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