Publication
Title
Atomic-scale identification of novel planar defect phases in heteroepitaxial thin films
Author
Abstract
We have discovered two novel types of planar defects that appear in heteroepitaxial YBa2Cu3O7-delta(YBCO123) thin films, grown by pulsed-laser deposition (PLD) either with or without a La2/3Ca1/3MnO3 (LCMO) overlayer, using the combination of highangle annular dark-field scanning transmission electron microscopy (HAADF-STEM) imaging and electron energy loss spectroscopy (EELS) mapping for unambiguous identification. These planar lattice defects are based on the intergrowth of either a BaO plane between two CuO chains or multiple Y-O layers between two CuO2 planes, resulting in non-stoichiometric layer sequences that could directly impact the high-Tc superconductivity. (C) 2018 Author(s).
Language
English
Source (journal)
AIP advances / American Institute of Physics. - Melville, NY, 2011, currens
Publication
Melville, NY : American Institute of Physics, 2018
ISSN
2158-3226
Volume/pages
8:5(2018), 7 p.
Article Reference
055022
ISI
000433954000022
Medium
E-only publicatie
Full text (Publisher's DOI)
Full text (open access)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 10.07.2018
Last edited 14.09.2021
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