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Title
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Orthorhombic vs. hexagonal epitaxial thin films : structural stability and related electrical transport properties
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Author
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Abstract
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| Metastable orthorhombic SrIrO3 (SIO) is an arch-type spin-orbit coupled material. We demonstrate here a controlled growth of relatively thick (200 nm) SIO films that transform from bulk "6H-type" structure with monoclinic distortion to an orthorhombic lattice by controlling growth temperature. Extensive studies based on high-resolution X-ray diffraction and transmission electron microscopy infer a two distinct structural phases of SIO. Electrical transport reveals a weak temperature-dependent semi-metallic character for both phases. However, the temperature-dependent Hall-coefficient for the orthorhombic SIO exhibits a prominent sign change, suggesting a multiband character in the vicinity of E-F. Our findings thus unravel the subtle structure-property relation in SIO epitaxial thin films. Copyright (C) EPLA, 2018 |
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Language
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English
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Source (journal)
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Europhysics letters / Société européenne de physique. - Les Ulis, 1986, currens
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Publication
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Les Ulis
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Les éditions de physique
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2018
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ISSN
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0295-5075
1286-4854
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DOI
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10.1209/0295-5075/122/28003
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Volume/pages
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122
:2
(2018)
, 6 p.
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Article Reference
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28003
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ISI
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000435517300001
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Medium
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E-only publicatie
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Full text (Publisher's DOI)
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Full text (publisher's version - intranet only)
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