Publication
Title
Single atom detection from low contrast-to-noise ratio electron microscopy images
Author
Abstract
Single atom detection is of key importance to solving a wide range of scientific and technological problems. The strong interaction of electrons with matter makes transmission electron microscopy one of the most promising techniques. In particular, aberration correction using scanning transmission electron microscopy has made a significant step forward toward detecting single atoms. However, to overcome radiation damage, related to the use of high-energy electrons, the incoming electron dose should be kept low enough. This results in images exhibiting a low signal-to-noise ratio and extremely weak contrast, especially for light-element nanomaterials. To overcome this problem, a combination of physics-based model fitting and the use of a model-order selection method is proposed, enabling one to detect single atoms with high reliability
Language
English
Source (journal)
Physical review letters. - New York, N.Y.
Physical review letters. - New York, N.Y.
Publication
New York, N.Y. : 2018
ISSN
0031-9007
Volume/pages
121 :5 (2018) , 6 p.
Article Reference
056101
ISI
000440143200007
Pubmed ID
30118288
Medium
E-only publicatie
Full text (Publisher's DOI)
Full text (open access)
UAntwerpen
Faculty/Department
Research group
Project info
Bringing light atoms to light: precise characterization of light-atom nanostructures using transmission electron microscopy.
Picometer metrology for light-element nanostructures: making every electron count (PICOMETRICS).
Dose-efficient fusion of imaging and analytical techniques in scanning transmission electron microscopy.
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 21.08.2018
Last edited 20.11.2021
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