Publication
Title
Single atom detection from low contrast-to-noise ratio electron microscopy images
Author
Abstract
Language
English
Source (journal)
Physical review letters. - New York, N.Y.
Publication
New York, N.Y. : 2018
ISSN
0031-9007
Volume/pages
121:5(2018), 6 p.
Article Reference
056101
ISI
000440143200007
Full text (Publisher's DOI)
Full text (open access)
UAntwerpen
Faculty/Department
Research group
Project info
Bringing light atoms to light: precise characterization of light-atom nanostructures using transmission electron microscopy.
Picometer metrology for light-element nanostructures: making every electron count (PICOMETRICS).
Dose-efficient fusion of imaging and analytical techniques in scanning transmission electron microscopy.
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Record
Identification
Creation 21.08.2018
Last edited 08.09.2018
To cite this reference