Publication
Title
Structural characterisation of erbium silicide thin films of an Si(111) substrate
Author
Abstract
Language
English
Source (journal)
Journal of alloys and compounds. - Amsterdam
Publication
Amsterdam : 1996
ISSN
0925-8388
Volume/pages
234:2(1996), p. 244-250
ISI
A1996TX65100020
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 02.10.2018
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