| Title |
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Structural characterisation of erbium silicide thin films of an Si(111) substrate
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| Author |
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| Abstract |
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| Language |
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English
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| Source (journal) |
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Journal of alloys and compounds. - Amsterdam |
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| Publication |
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Amsterdam : 1996
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| ISSN |
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0925-8388
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| Volume/pages |
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234:2(1996), p. 244-250
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| ISI |
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A1996TX65100020
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| Full text (Publisher's DOI) |
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| Full text (publisher's version - intranet only) |
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