Publication
Title
Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate
Author
Language
English
Source (journal)
Applied surface science. - Amsterdam
Publication
Amsterdam : 1996
ISSN
0169-4332
Volume/pages
102(1996), p. 163-168
ISI
A1996VJ86100037
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 14.11.2017
To cite this reference