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Title
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Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate
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Author
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Language
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English
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Source (journal)
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Applied surface science. - Amsterdam
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Publication
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Amsterdam
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1996
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ISSN
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0169-4332
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DOI
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10.1016/0169-4332(96)00040-2
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Volume/pages
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102
(1996)
, p. 163-168
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ISI
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A1996VJ86100037
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Full text (Publisher's DOI)
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