| Title |
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High crystalline quality erbium silicide films on (100) silicon grown in high vacuum
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| Author |
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| Language |
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English
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| Source (journal) |
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Applied surface science. - Amsterdam | |
| Publication |
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Amsterdam : 1996
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| ISSN |
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0169-4332
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| Volume/pages |
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102(1996), p. 151-155
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| ISI |
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A1996VJ86100034
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| Full text (Publisher's DOI) |
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