Publication
Title
The atomic lensing model : new opportunities for atom-by-atom metrology of heterogeneous nanomaterials
Author
Abstract
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2019
ISSN
0304-3991
Volume/pages
203(2019), p. 155-162
ISI
000465021000020
Full text (Publisher's DOI)
Full text (open access)
The author-created version that incorporates referee comments and is the accepted for publication version Available from 07.12.2020
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Project info
Complex hetero-nanosystems: three-dimensional characterisation down to the atomic scale.
Dose-efficient fusion of imaging and analytical techniques in scanning transmission electron microscopy.
Picometer metrology for light-element nanostructures: making every electron count (PICOMETRICS).
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 18.12.2018
Last edited 02.06.2019
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