Publication
Title
The atomic lensing model : new opportunities for atom-by-atom metrology of heterogeneous nanomaterials
Author
Abstract
The atomic lensing model has been proposed as a promising method facilitating atom-counting in heterogeneous nanocrystals [1]. Here, image simulations will validate the model, which describes dynamical diffraction as a superposition of individual atoms focussing the incident electrons. It will be demonstrated that the model is reliable in the annular dark field regime for crystals having columns containing dozens of atoms. By using the principles of statistical detection theory, it will be shown that this model gives new opportunities for detecting compositional differences.
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2019
ISSN
0304-3991
Volume/pages
203(2019), p. 155-162
ISI
000465021000020
Pubmed ID
30541675
Full text (Publisher's DOI)
Full text (open access)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Project info
Complex hetero-nanosystems: three-dimensional characterisation down to the atomic scale.
Dose-efficient fusion of imaging and analytical techniques in scanning transmission electron microscopy.
Picometer metrology for light-element nanostructures: making every electron count (PICOMETRICS).
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 18.12.2018
Last edited 19.07.2021
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