Publication
Title
Depth profiling of silver halide microcrystals
Author
Language
English
Source (book)
Secondary Ion Mass Spectrometry SIMS VIII: proceedings of the International Conference on Secondary Ion Mass Spectrometry / Benninghoven, A. [edit.]
Publication
Chichester : Wiley, 1991
Volume/pages
8(1991), p. 479-482
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Record
Identification
Creation 08.10.2008
Last edited 12.09.2013
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