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Title
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Depth profiling of silver halide microcrystals
| |
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Author
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Language
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English
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Source (book)
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Secondary Ion Mass Spectrometry SIMS VIII: proceedings of the International Conference on Secondary Ion Mass Spectrometry / Benninghoven, A. [edit.]
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Publication
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Chichester
:
Wiley
,
1991
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Volume/pages
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8
(1991)
, p. 479-482
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