| Title |
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Depth profiling of silver halide microcrystals
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| Author |
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| Language |
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English
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| Source (book) |
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Secondary Ion Mass Spectrometry SIMS VIII: proceedings of the International Conference on Secondary Ion Mass Spectrometry / Benninghoven, A. [edit.] | |
| Publication |
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Chichester : Wiley, 1991
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| Volume/pages |
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8(1991), p. 479-482
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